Thursday, March 30, 2017

Survival Analysis – Reliability Theory / Human Life – Transistor’s Life (Part 5)

Life of an electronic device
The life of an electronic device might not have as many shades of color as in a human life. But it still has some shades that make it a playground of chance factor and randomness. This can be illustrated by the fact that the number of times an electronic device becomes out of order before it is totally discarded is a discrete random variable. The time of first failure of a device is a continuous random variable. The time between two consecutive failures of a device is continuous random variables.  The failure in a device can be related to the occurrence of illness in human lives. The time taken to repair a device is a continuous random variable. The failure rate or hazard rate is bath tub like curve as in human force of mortality. The failure rate of device is the highest in the first few days of its installation and in the last days. High value of hazard rate in the last days is due to wear and tear of the device. Further the lifetimes of electronic devices and batteries have lack of memory property. This implies that time of failure of the device has “no memory” of how long that device has already worked.


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